Particle size analysis services in the USA
Sem/eds analysis company by MicroVision Laboratories? ?We partner with companies in all phases of product development and sales, including R&D, manufacturing, QC, advertising and failure analysis. Our laboratory offers a highly-trained and experienced staff utilizing a powerful set of analytical tools (SEM with EDS and backscatter detectors, Bruker X-Flash elemental mapping, X-Ray imaging, Micro-FTIR spectroscopy, Micro-XRF, light microscopy, cross sectioning/precision polishing and microhardness testing).
The desired chip packages were sectioned from the larger board, and placed in an epoxy mounting cup. The epoxy was mixed and allowed to harden. The resulting epoxy puck was cross sectioned and polished. The epoxy mounting and cross sectioning process gave precise, perfectly preserved cross sectional surfaces through the desired components and their solder bonds. Discover even more info on edx analysis.
An affected floor tile was submitted to determine if the previous mold testing had missed a source on the tile backing or mastic. Additionally, a new tile from the same manufacturing lot was submitted for comparison. The process of preparing and examining the sample and reference tile was documented. Areas with darkened surface features were imaged and then cut out and examined. While the dark spots looked very discrete when examined by eye, under top light polarized microscopy they appeared more diffuse at the outer edges. The darkest areas surrounded what appeared to be particles embedded in the surface.
Do you give lab tours? Yes, we routinely give lab tours to our clients and potential clients. Please call and we would be happy to schedule a tour for you and your co-workers. Do you have other locations around the country? We do work for companies all across the United States, with one laboratory which is located in Chelmsford, Massachusetts. Did MicroVision Labs ever operate under a different company name? No, we have always been MicroVision Laboratories, Inc. Our founder, John Knowles, used to work for another laboratory that underwent several name changes (Eastern Analytical Laboratories, Industrial Environmental Analysts, American Environmental Network, Severn Trent Laboratories, and EMLab P&K Billeria) and was located nearby in Billerica. When that laboratory was closed in 2008, John hired a few of the remaining analysts and acquired its equipment, client list and phone number.
Using light microscopes to examine the optical and structural properties of samples is one of the oldest and most useful analytical techniques. MicroVision Labs has several high magnification microscopes, including a powerful Zeiss Axiotech microscope capable of 1800x optical magnification, with additional digital magnification, allowing for visualization of sub-micron structures. PLM allows for the identification of a wide range of particles through the examination of the internal birefringence, or variation in optical indices, within a sample. Discover a few more details on https://microvisionlabs.com/.
Analysis and Results: The submitted bottle was examined for signs of interior distress, and the water from the bottle was removed and maintained. Some of the suspended particulate was filtered and examined non-destructively by light microscopy first, to characterize the material. A low magnification stereo microscope image of the filtered white particulate is shown in the image above. From this image, biological tissues were ruled out, and the material was observed to be crystalline. Polarized light microscopy (PLM) was used to analyze the sample next. From this examination, the material showed birefringence as shown in the PLM image on the right. The PLM Image Stereo Microscope image suspect material showed optical properties and morphology dissimilar to common carbonates and sulfates. It was determined to be a birefringent crystalline material, but it could not be identified using only PLM methods. Therefore, analysis using scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS) would have to be performed to obtain further information about the suspect material.
